飞行时间二次离子质谱仪（TOF-SIMS） MidiSIMS-ToF-HR (CAS No.None)

Product Name:Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) MidiSIMS-ToF-HR

English Name:Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) MidiSIMS-ToF-HR

Aliases:MidiSIMS-ToF-HR, TOF-SIMS, Secondary Ion Mass Spectrometer

Physical Properties:A benchtop time-of-flight secondary ion mass spectrometer equipped with an orthogonal reflectron time-of-flight mass analyzer and a 25 kV liquid metal ion gun (LMIG) as the primary ion source. The vacuum chamber is stable and vibration-resistant, featuring two opposing 114 mm outer diameter ion gun ports compatible with LMIS, C60, GCIB, DUOplasmatron and other primary ion sources. The integrated high-voltage design shortens sample pump-down time and supports Static SIMS, Imaging SIMS and Dynamic SIMS modes.

Uses:Used for surface composition analysis in fields such as surface coatings, electronic components and semiconductors, electrodes and sensors, catalysts, adhesives, thin films, corrosion research, biomaterials, contaminants, and storage devices. It can simultaneously analyze all elements and organic compounds, eliminating organic and elemental interferences, making it suitable for industrial quality control, failure analysis, and scientific research.

Technical Specifications:

A 25 kV liquid metal ion gun (LMIG) serves as the primary ion source, providing high detection capability and high mass resolution.

Equipped with two opposing 114 mm outer diameter ion gun ports, compatible with LMIS, C60, GCIB, DUOplasmatron and other primary ion sources.

An orthogonal reflectron time-of-flight mass analyzer supports continuous beam mode, significantly improving imaging performance.

High duty cycle operation mode enables high-speed data acquisition.

Optional energy filter, secondary electron detector (SED) and electron beam function are available.